Research Showcase
Recent Advances on Reliability and Gate Driving of WBG Power ElectronicsThis Research Showcase covers „Recent Advances on Reliability and Gate Driving of WBG Power Electronics“ with presentations by Warwick, Nottingham, Bristol, Newcastle, Edinburgh and Aalborg Universities.
This is the first in a series of Research Showcases organised by IMAPS-UK to highlight leading research and development activities in the UK on advanced electronics design, manufacturing, testing and reliability.
It addresses several of the key issues critical to the increased adoption of Wide Bandgap (WBG) Semiconductors within the growing power electronics industry, including:
- Gate Interface Reliability in SiC/GaN power devices
- Latest Advances in Packaging/Interconnects
- High Speed Sensing and Monitoring around GaN devices
- Optimisation of switching transients for SIC MOSFETs
- High Current SiC Applications
- Testing of SiC MOSFETs under normal and abnormal operations
The presenters have a long-established track record of research into SiC characterisation and reliability (Warwick, Edinburgh and Aalborg), power module reliability characterisation (Nottingham), converter-level condition monitoring for power electronics (Newcastle) and GaN based power electronics (Bristol).
The showcase will take place on 11th and 12th of January 2021 from 10:00 am to 12:30 pm. This is a free to join event, please log in or register on IMAPS UK to book a place. Once registered, you will receive joining instructions by e-mail 2-3 days before the event. Bookings can be accepted up to 1 hour prior to the event start.